Abstract:
Atomic Force Microscopy (AFM), without any
doubt can be named as one of the most sensitive
imaging techniques which allows researchers to explore
a broad spectrum of materials such as semiconductors,
nanocrystals, biological materials, pharmaceuticals,
polymers etc. 1 In recent years, AFM has demonstrated
the ability of generating images with resolutions high
enough to visualize sample features measured in
fractions of nanometers or “atomic resolution”.