Atomic Force Microscopy

dc.contributor.author	Rupasinghe, Thilini p.
dc.date.accessioned	2021-03-22T05:13:07Z
dc.date.available	2021-03-22T05:13:07Z
dc.date.issued	2019-01
dc.identifier.uri	http://ichemcdr.com:8080/xmlui/handle/123456789/23
dc.description	page 6 - 8	en_US
dc.description.abstract	Atomic Force Microscopy (AFM), without any doubt can be named as one of the most sensitive imaging techniques which allows researchers to explore a broad spectrum of materials such as semiconductors, nanocrystals, biological materials, pharmaceuticals, polymers etc. 1 In recent years, AFM has demonstrated the ability of generating images with resolutions high enough to visualize sample features measured in fractions of nanometers or “atomic resolution”.	en_US
dc.language.iso	en	en_US
dc.publisher	Institute of Chemistry Ceylon	en_US
dc.relation.ispartofseries	36;1
dc.subject	Microscopy	en_US
dc.subject	Atomic	en_US
dc.title	Atomic Force Microscopy	en_US
dc.title.alternative	Is it Just an Emaging Technique?	en_US
dc.type	Article	en_US